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ПОСЛЕДНИЕ ПУБЛИКАЦИИ

Defect Formation in Supported Graphene Irradiated by Accelerated Xenon Ions / E.A. Kolesov, M.S. Tivanov, O.V. Korolik, P.Yu. Apel, V.A. Skuratov, A. Saad, I.V. Komissarov // Journal of Materials Science: Materials in Electronics. – 2018. – Volume 29, Issue 4 – Pages 3296–3303.
Raman spectra of graphene synthesized by chemical vapor deposition from decane / M.S.Tivanov, E.A.Kolesov, O.V.Korolik, A.M.Saad, N.G.Kovalchuk, I.V.Komissarov, V.A.Labunov, M.Opielak, P.Zukowski, T.Kołtunowicz // Journal of Applied Spectroscopy. – 2018. – Volume 84, No. 6 – Pages 979-985.
Microstructure and Raman scattering of Cu2ZnSnSe4 thin films deposited onto flexible metal substrates / А.V.Stanchik, V.F.Gremenok, S.А.Bashkirov, М.S.Тivanov, R.L.Juškėnas, G.F.Novikov, R.Giraitis, A.M.Saad // Semiconductors. – 2018. – Volume 52, No 2 – Pages 215-220.
Effect of the Substrate on Phonon Properties of Graphene Estimated by Raman Spectroscopy / M.S.Tivanov, E.A.Kolesov, O.V.Korolik, A.M.Saad, I.V.Komissarov // Journal of Low Temperature Physics. – 2018. – Volume 190. – Pages 20-25. DOI: 10.1007/s10909-017-1807-x.
Effect of Substrate temperature on Structural and Optical properties of In2S3 thin films grown by Thermal evaporation / S.Rasool, G.Phaneendra Reddy, K.T.Ramakrishna Reddy, M.Tivanov, V.F.Gremenok // Materials Today Proceedings. – 2017. – Volume 4, Issue 14 – Pages 12491-12495. DOI: 10.1016/j.matpr.2017.10.049.
Eu Modified Cu2O Thin Films: Significant Enhancement in Efficiency of Photoelectrochemical Processes through Suppression of Charge Carrier Recombination / S. Shyamal, P. Hajra, H. Mandal, A. Bera, D. Sariket, A.K. Satpati, M.V. Malashchonak, A.V. Mazanik, O.V. Korolik, A.I. Kulak, E.V. Skorb, Ajun Maity, E.A. Streltsov, C. Bhattacharya // Chemical Engineering Journal. – 2017. DOI: 10.1016/j.mssp.2017.09.009.
Optical properties of thermally evaporated In2S3 thin films measured using photoacoustic spectroscopy / S. Rasool, K. Saritha, K. T. Ramakrishna Reddy, K. Raveendranath Reddy, L. Bychto, A. Patryn, M. Maliński, M. S. Tivanov, V. F. Gremenok // Materials Science in Semiconductor Processing. – 2017. – 72. – 4–8. DOI: 10.1016/j.mssp.2017.09.009.